Technical Document Avalanche Capability of Vertical GaN™ p-n Junctions on Bulk GaN Substrates
NexGen’s Vertical GaN™ technology possesses robust Avalanche capability
In this technical document we discuss:
- Inductive Avalanche test results on GaN p-n diodes
- Results of repetitive Avalanche ruggedness testing
- Conclusions of Vertical GaN™ Avalanche capability